FemtoScan Inlight

For combined studies using AFM and interference microscopy

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Scan Modes:

Atomic force microscopy
Scanning tunneling microscopy
Scanning resistance microscopy
Remote control of experimen

Magnetic force microscopy
Nanolithography
Electrostatic force microscopy
Optical microscopy with internet data transmission

Study of changing surface dynamics

FemtoScan Inlight is used to accurately measure the topography of reflective objects, it can be used to observe the flatness of a dynamically changing surface (for example, the face of a growing crystal), to measure film thickness (height of protrusions formed by the edges of the film and substrate). The microscope allows to explore samples in air and in liquid area. The principle of operation is based on the interference of rays reflected from the surface of the sample under investigation with a reference luminous flux of the same intensity.

Technical specifications

Parameter	Value
Laser wavelength, laser capacity	650 nm, 4.5 mW
Horizontal resolution	1000 nm (500 nm)*
Vertical resolution	160 nm
Maximum field of view	3334x2500 mcm
Frame size at maximum magnification	800x600 mcm (400x300 mcm*)
Maximum image resolution	800x600 px
Frame rate	15 c^-1
Dimensions	240x310x350 mm
Weight	5,5 kg

* for using an additional eyepiece lens

Images taken with FemtoScan Inlight

Interference image of crystal salt

Optical image of crystal salt in red laser illumination

FemtoScan Inlight

Scan Modes:

Study of changing surface dynamics

Technical specifications

Images taken with FemtoScan Inlight

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Educational course "Scanning probe microscopy"

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