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+7(495) 926-37-59
spm@nanoscopy.ru

Training «Scanning Probe Microscopy»

Nanoscopy training is a most efficient way for students studying in field of nanotechnology; it includes a wide range of equipment, educational programs and presentations for nanoscopy research - the most effective way to teach today's students nanotechnology.

"FemtoScan Online traning" is a fully equipped laboratory for 7-25 workplaces. At the lab students get an introduction to nanotechnology in 5-6 sessions. A more detailed study can be achieved through Internet access to the laboratory (from home, lab or an Internet cafe)

 

FemtoScan Laboratory system includes:

  • one or several microscopes FemtoScan supplied with Image processing software FemtoScan Online

  • workstations for data processing

  • system security and access control system

  • high-speed network with a central server station

  • software for the microscope operating and for data processing

  • a set of programs for demonstration of nanotechnology possibilities

  • Nanotechnology Tutorial

 

Program of training course on SPM FemtoScan operation

  • 1.Introduction
    • a.Principal scheme of SPM
      • I.Positioning system
      • II.Probe and the system for determination of its state
      • III.Feedback system
    • b.Surface scanning
      • I.With feedback
      • II.Without feedback
    • c.General measurement technique
      • I.Preparation of the sample and the microscope
      • II.Surface measurements and parameters adjusting
      • III.Processing and interpretation of the data
  • 2.Terminology
    • a.Cantilever
    • b.Probe
    • c.Holder
    • d.Head
    • e.Stage
  • 3.Scanning Probe Microscope FemtoScan
    • a.The general form
    • b.Mechanical part
    • c.The electronic unit
    • d.Scanning heads
      • IAtomic force microscope
      • IIScanning tunneling microscope
  • 4.Schematic diagrams of the microscope operating in different modes
    • a.Atomic Force Microscopy
    • b.Scanning Resistive Microscopy
    • c.Tapping Mode Atomic Force Microscopy
    • d.Tunneling Microscopy
  • 5.Measurements in the scanning tunneling microscopy mode
    • a.Preparation of the sample, providing ohmic contact with the sample
      • I.With the sample
      • II.With the special holder under the sample
    • b.Installing the sample on the scanning stage
    • c.Preparation of the needle
    • d.Installation of the needle to the tunneling head
    • e.Connecting the head to the mechanical part
    • f.Installation of the head above the sample
    • g.A preliminary approach of the needle to the surface
    • h.Screening of the microscope from external noise
    • i.The initial set of control parameters
    • j.Approaching the surface
    • k.The choice of operating point
    • l.Surface scanning
    • m.Measuring of the tunneling current dependence on the distance
    • n.Measuring of the current-voltage characteristics of the tunneling contact
    • o.Processing of the experimental data. Differential current-voltage characteristics of the tunneling contact.
  • 6.Measurements in atomic force microscopy mode
    • a.Preparation of the sample
    • b.Cantilever installation in the holder
    • c.Holder installation in the AFM head
    • d.Tuning of the laser
      • I.Using diffraction pattern from cantilever
      • II.Search the edge of cantilever using the reflected spot
      • III.Tuning of the photodiod
    • e.Installation of the sample on the scanning stage
    • f.Installation of head above the sample
    • g.The initial set of control parameters
    • h.Surface approaching
    • i.Measuring of the force-distance curve
    • j.The choice of operating point
    • k.Scanning of the surface
    • l.Mode for measuring of the lateral force
    • m.Determination of the elastic properties of the surface
    • n.Image processing
  • 7.Measurements in scanning resistance microscopy mode
    • a.Preparation of the sample, providing ohmic contact with the sample
      • I.With the sample
      • II.With a special table under the sample
    • b.Installation of the cantilever into the holder, providing the contact with the probe
    • c.Resistance cable connecting
      • I.With the head
      • II.With the holder
      • III.With the sample
    • d.Holder installation in the head
    • e.Tuning of the laser
      • I.Using diffraction pattern from cantilever
      • II.Search the edge of cantilever using the reflected spot
      • III.Tuning of the photodiod
    • f.Installation of the sample on the scanning stage
    • g.Installation of head above the sample
    • h.Checking the conduction signal
    • i.Additional screening of the microscope against external noise
    • j.The initial set of control parameters
    • k.Pre-positioning of the scanner
    • l.Surface approaching
    • m.Measuring of the force-distance curve
    • n.Measuring of the electrical current-distance curve
    • o.The choice of operating point
    • pScanning of the surface
    • q.Image processing
    • r.The calculation of contact resistance and the local conductivity of the surface
  • 8.Measurements in tapping mode of atomic force microscope
    • a.Preparation of the sample
    • b.Installation of cantilever in the holder
    • c.Connecting the excitation voltage cable
    • d.Installation of the holder in the head
    • e.Tuning of the laser
      • I.Using diffraction pattern from cantilever
      • II.Search the edge of cantilever using the reflected spot
      • II.Tuning of the photodiod
    • f.Installation of the sample on the scanning stage
    • g.Installation of head above the sample
    • h.The initial set of control parameters
    • i.Tuning in to the cantilever resonance
    • j.Surface approaching
    • k.Measuring of the oscillation amplitude - distance curve
    • l.The choice of operating point
    • m.Scanning of the surface
    • n.Phase image
    • o.Image processing
  • 9.Basic knowledge of software
    • a.Client program FemtoScan Online
    • b.Program Fmboard to manage the server of the microscope
    • c.Connecting to a microscope
    • d.The toolbar for the control of the microscope
    • e.The scan window (the main window)
    • f.The main modes of the microscope operation
    • g.Run scans
    • h.Basic operations with images
      • I.color scales
      • II.averaging over the rows
      • III.surface leveling
      • IV.usage of different filters
      • V.Fourier spectrum of an image
      • VI.three-dimensional representation of the surface
      • VII.construction of cross sections and the measurement of objects heights
      • VIII.function of the finding of objects

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